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±â¼ú »ç¾çÀº ¾Æ·¡
ǰ¸ñ Ŭ¸¯ ÇÏ½Ã¸é µË´Ï´Ù.)
5.
3Â÷¿ø Ç¥¸éÇü»ó(Topography) -Ç¥¸é°ÅÄ¥±â & Wavness & ÆòÆòµµ,ÈÚ,ºñƲ¸²
& ¾ËÆÄ½ºÅÜ(ÄÚÆÃ µÎ²²ÃøÁ¤)
& SPM(=AFM+STM), ÁõÆø±â
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1. ´Ù¾çÇÑ 3Â÷¿ø Ç¥¸é ¹× ¹× Çü»ó ÃøÁ¤±â(Nano meter/Micron´ÜÀ§)
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2. ¼öÁ÷ Angstrom,Nano,Micro´ÜÀ§ ºÐÇØ´É ÃøÁ¤À» ÇÑÃøÁ¤±â¿¡¼!
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3. »ý»ê¶óÀÎ °í¼ÓÀû¿ë 3Â÷¿ø ÃøÁ¤±â
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4. ºñÁ¢ÃË½Ä 3Â÷¿ø ÃøÁ¤±â---->
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5. ÈÞ´ë¿ë 3Â÷¿ø ÃøÁ¤±â-¿ÉƽŸÀÔ
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6.
¸¶ÀÌÅ©·Î´ÜÀ§ PCB¸ðµâµîÀÇ ´ÜÀ§ °¡µ¿¼º Ç¥¸é°Ë»çºÐ¼®±â --->Nikon»çÀÇ ¸ðµ¨ Nexiv
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7. Àú°¡Çü ½ºÀ§½ºÁ¦ Roughness
Meter(ÈÞ´ë¿ë
Ç¥¸é°ÅÄ¥±âÃøÁ¤)
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8. Á¢ÃË½Ä + ¿Éƽ¼¾¼¸¦ ÇÑ´ëÀÇ ÃøÁ¤±â¿¡¼ ±¸ÇöÇÑ 3Â÷¿øÃøÁ¤
Ãֽбâ¼ú
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9. Æòźµµ,ºñƲ¸², Stress ÃøÁ¤±â-2Â÷¿ø
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10. ¿þÀÌÆÛ Àü¿ë ¹× ¼ÒÀçÀÇ ÆòÆòµµ,ÈÚ,
µÎ²²ÃøÁ¤±â(TTV,µÎ²²)-3Â÷¿ø
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11. ¾ËÆÄ½ºÅÜ(¹Ú¸·ÀÇ ´ÜÂ÷,µÎ²² ÃøÁ¤±â)--->
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12. ÄÚÆÃµÎ²²ÃøÁ¤(IN-SITU ¹Ú¸·ÁõÂø°øÁ¤Á¦¾î), Ellipsometer |
13. Contact Profiler
(Á¢ÃË½Ä Ç¥¸é °ÅÄ¥±â, waviness, °¡°øÁ¤¹Ðµµ,
3Â÷¿ø ÃøÁ¤±â)--->¿¬±¸¿ë,ǰÁú°ü¸®¿ë-->
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14. SPM(=AFM & STM)-°í¼Ó,ÀüÀÚµ¿
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15. AFM(Atomic Force Microscope)-¹ÙÀÌ¿À,Åõ¸íÀçÁú ÃøÀû ºÐ¼®¿ë
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16. AFM + Raman Spectrometer
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17. STM, SPM, AFM(Atomic Force Microscope)-µ¶ÀÏÁ¦ Àú°¡Çü
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18.¿£Áø½Ç¸°´õ³»º®,ÇǽºÅæµî ¿£ÁøºÎǰ°Ë»çÃøÁ¤±â
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19.±â¾îÇ¥¸é, ¿£Áø½Ç¸°´õ³»º® µî ´Ù¾çÇÑ ÃøÁ¤±â
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20.»þÇÁƮǥ¸é, Seal ÃøÁ¤¿ë Lead Angle ÃøÁ¤±â
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21. Æí±¤°è (ÈÚ, µÚƲ¸² ÃøÁ¤±â)
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22. µ¶ÀÏÁ¦ ÁõÆø±â (·ÎÅ©ÀÎ ¾ÚÇÁ)
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0173 ÆÑ½º : 02 - 3411 - 0178 sales@gohanmi.com
    


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