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¸¶ÀÌÅ©·Î~³ª³ë ½ºÅ©·¡Ä¡ ½ÃÇè±â---ÄÚÆÃÁ¢Âø·Âµî Á¤·®Àû Æò°¡

Global BRUKER»çÀÇ Áö±×Àç±×½Ä + 3Â÷¿ø ¼öÁ÷ÇÏÁßÁ¦¾î/XYº¤ÅÍ ¸¶Âû·ÂÃøÁ¤¼¾¼­·Î ÄÚÆÃ ¹ÐÂø·Â Æò°¡ÀÇ Çõ½ÅÀ» ÀÌ·ç¾ú½À´Ï´Ù.

Apple»ç¿Í Intel»çÀÇ ¸ðµç Çù·Â»ç¿¡¼­ äÅÃÇÑ »õ·Î¿î ÄÚÆÃ Á¢Âø·Â ½ÃÇè¹æ½Ä ÀÔ´Ï´Ù.

Micro~Nano Tribology(¸¶Âû¸¶¸ð)½ÃÇèÆò°¡

¿ÞÂÊ ºê·çÄ¿»ç ·Î°í Ŭ¸¯ ÇϽøéÀº BRUKER»ç ȨÆäÀÌÁö ¸µÅ© µË´Ï´Ù.

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         Old Model UMT                                                                                                                                     New Model UMT-TRIBOLAB

 

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   aniblue12_next.gifÀ§ ´Ù¾çÇÑ ¹üÀ§ÀÇ ³ª³ë~¸¶ÀÌÅ©·Î~¸ÅÅ©·Î ÇÏÁßÁ¦¾î ¹× ¸¶Âû·Â ÃøÁ¤ 2Ãà ¼¾¼­¸¦   ÇÑ ´ëÀÇ ½ÃÇè±â¿¡¼­    ÇÊ¿äÇÑ ¹üÀ§¸¦ ¼±ÅÃÇÏ¿©   ³ª³ë ~¸¶ÀÌÅ©·Î ~¸ÅÅ©·Î °íÇÏÁßÀÇ   

½ºÅ©·¡Ä¡¿Í TRIBOLOGY ½ÃÇèÀ» ÇÑ ´ë¿¡¼­ ÇÒ ¼ö Àִ ÷´Ü ±â¼ú ÀÔ´Ï´Ù.

¿Õº¹Çü ¸¶Âû¿îµ¿ÀÇ ´Ù¾çÇÑ ¿îµ¿

BLOCK ON RING ´Ù¾çÇÑ ¸¶Âû¿îµ¿

   

 

 

ȸÀüÇü ÇÉ-¿Â-µð½ºÅ©,

µð½ºÅ©-¿Â-µð½ºÅ© ÀÇ ´Ù¾çÇÑ ¸¶Âû¿îµ¿

 

 

 

 

Àú¼Ó ¿Õº¹Çü°ú ¿­½ÊÀÚÇü ¸¶Âû¿îµ¿ °¡´É

 

 

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½ºÅ©·¹Ä¡ ½ÃÇè½Ã Á¤·®Àû ºÐ¼®À» À§ÇØ ´Ù¾çÇÑ ÃøÁ¤¼¾¼­°¡ Àû¿ëµÈ´Ù.

Ư¼öÀ½Çâ¼¾¼­,¸¶Âû°è¼ö¼¾¼­,Ç¥¸éÀúÇ×,Àü±âÀúÇ×,

ÆÄ³ë¶ó¹Í À̹ÌÁö ÃøÁ¤ Çö¹Ì°æ, µî

 

»ùÇÃÀÇ ¼ºÁú¿¡ µû¶ó ´Ù¾çÇÑ ½ºÅ©·¡Ä¡ TipÀÌ °ø±ÞµÈ´Ù.

DLC ÄÚÆÃµÈ ½ÃÆíÀÇ ½ºÅ©·¹Ä¡ ½ÃÇèÀ» À§ÇÏ¿© »óÈçÃøÁ¤ Çö¹Ì°æ,

ÃøÁ¤ ¼¾¼­, Tipµî ¼¼ÆÃ Àü°æ

 

Panoramic Image ºÐ¼®±â¹ý--->

 

 ½ºÅ©·¹Ä¡ ½ÃÇè½Ã, ¼ö½ÊÀåÀÇ ½ºÅ©·¡Ä¡ »óÈç À̹ÌÁö¸¦ ÃøÁ¤ÇÏ¿©, ÇѰ³ÀÇ »çÁøÀ¸·Î

À̹ÌÁöÈ­ÇÏ¿©(Panoramic±â¹ý) »óÈçÀÇ À̹ÌÁö¿Í ÃøÁ¤¼¾¼­(¸¶Âû°è¼ö,À½Çâ¼¾¼­,     ECRÇ¥¸éÀúÇ×ÃøÁ¤¼¾¼­)ÀÇ ¼öÄ¡µîÀ» ÀÌ¿ëÇÏ¿© ±×¶óÇÁ¿¡¼­ µ¿±âÈ­ÇÑ Á¤·®ºÐ¼®±â¹ý

 

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½ºÅ©·¹Ä¡ ½ÃÇè±â¿¡ ¿É¼Ç ÀåÄ¡·Î

Micro Indenting HardnessÃøÁ¤°¡,Optical 3D,AFMµî ÀåÂø °¡´É

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          ÃÖ÷´Ü±â¼úÀÇ »ó¡ BRUKER»ç!!!

¸ðµ¨ UMT (Universal Mechanical & Tribology Tester)   

 

     Scratch TesterÀÇ Ä«Å¸·Î±×(English,¿µ¹®)

     ¸¶Âû¸¶¸ðÀ±È° ½ÃÇè±âÀÇ ´Ù¾çÇÑ ½ÃÇè¸ðµâµé°ú, ½ºÅ©·¡Ä¡½ÃÇè±â, ³ª³ëÀε§ÅÍ µî--ÀϹÝÀû ¼Ò°³ -µ¿¿µ»ó

      

 

½Ç¸®Äܹ븮 ÃÖ÷´Ü Micro/Nano Tribology ±â¼ú, ÀÚü ¼¾¼­±â¼ú·Î ±âÁ¸ÀÇ Æ®¶óÀ̺¼·ÎÁö¿Í Nano ¹°¼º ½ÃÇè¿¡ ´ëÇÑ °³³äÀ» Çõ½ÅÇÏ¿© ±¤¹üÀ§ÇÑ ½ÃÇè ±¸Çö!

 

1.ÃøÁ¤¿ä¼Ò

  

 Á¢Âø°­µµ ÃøÁ¤¿ä¼Ò : -Scratch Hardness Test

                             -Scratch Adhesion Test(Áö±×Àç±×, 3D¼¾¼­·Î Çõ½ÅÀûÀÎ ±â¼ú °³¹ß)

                     -Delamination/Ahdesion

                     -Friction/Wear/Deformation

 

 ¹°¼º ÃøÁ¤¿ä¼Ò : -NANO Hardness/NANO Indenting

                 -Micro Hardness

                 -Creep/Elastic Modulus/Youngs Modulus

                 -Tensile/Compression

                 -Penetration/Piercing Resistance.

                 -Sharpness

 

 ¸¶Âû¸¶¸ðÀ±È°ÃøÁ¤¿ä¼Ò : -´Ù¾çÇÑ ÀçÁúÇ¥¸éÀÇ ¸¶Âû¸¶¸ðÀ±È°(TRIBOLOGY)Ư¼º ¹× ÄÚÆÃÆ¯¼º ÃøÁ¤

                        -Àü¹®ÀûÀΠȸÀü½Ä Pin on disc(0.1~5,000rpm)

                        -¿Õº¹µ¿½Ä¸¶Âû¸¶¸ð(50Hz)/Block on Ring/Fourball

                        -±¤µð½ºÅ©µîÀÇ TribologyƯ¼º   

                        -Hard DiskÇ¥¸éÀÇ ¸¶Âû°è¼ö¿Í ¿­Æ¯¼º ½ÃÇè

                        -CMP TEST

 

 

 AFM/Optical Microscope ¿É¼Ç

 

       ´Ù¾çÇÑ Ä¡±¸¿Í ¼¾¼­·Î ÇÑ °èÃø±â³»¿¡¼­ À§¿Í °°Àº  Nano~Micro~Macro´ÜÀ§ÀÇ

       ¹°¼º¹× Ç¥¸é,°è¸éƯ¼ºÀ» ¿Ïº®È÷ ºÐ¼®ÇÒ ¼ö ÀÖ´Â °í±â´É Àåºñ ÀÓ.

 

 

Ư¼ö½ÃÇèȯ°æ Á¦¾î

   Scratch, Tribology ½ÃÇè½Ã(Ÿ»çÀÇ ½ÃÇè±â´Â ¾Æ·¡ ½ÃÇèȯ°æ Á¦¾î°¡ ´ëºÎºÐ ºÒ°¡´É ÇÕ´Ï´Ù):

    ¿ÂµµÁ¶Àý:  20C to 1,000C heating-only   or     -25C to 350C heating+cooling
    ½ÀµµÁ¶Àý :  Humidity Control from 0 to 100% RH, with or without temperature control,
    È­ÇÐÀûºÎ½Ä½ÃÇè: Corrosive Electro-Chemical Chamber with an integrated potentiostat/galvanostat
    Áø°øÃ¨¹ö:- 10-6 Torr (10-9 bar, 0.1 mPa) standard, 10-7 Torr (10-10 bar, 0.01 mPa) optional
    Inert gases option

 

 

                                                             Scratch Àü¿ë½ÃÇè±â ÀÏÁ¦

2.Ư¡

 

   A. ADHESION(Á¢Âø·Â)

   ¼¼°èÃÖÃÊ·Î ÇÑ ½ÃÇè±â¿¡¼­ ÄÚÆÃÀÇ Adhesion(Á¢Âø·Â)À» ½ÃÇèÇÏ´Â 5°¡Áö ¹æ½ÄÀÎ

   Tape test/Stud-Pull test/Scratch test/indentation test/¸éµµ³¯¿¡ ÀÇÇÑ ¹æ½ÄµîÀ» ¼öÇàÇÏ¿©,

   ¹Ú¸·°ú Èĸ·ÀÇ Á¢Âø·ÂÀ» Á¤È®ÇÏ°í ´Ù¾çÇÏ°Ô ÃøÁ¤ÇÑ´Ù.

   ¶ÇÇÑ, °í±Þ ÆòÆÇ À¯¸®/½ºÅ×Àη¹½º ½ºÆ¿ ½ÃÆ® ¹× Á¢ÂøÁ¦ÀÇ »ó´ë¹°Áú¿¡ ´ëÇÑ Á¢Âø·Â ½ÇÇèµµ ´Ù¾çÇÑ   

    Áö±×¿¡ ÀÇÇØ °¡´É.

   ½Ã½ºÅÛÀÇ ÇÏÁßÁ¦¾î ¹æ½ÄÀÌ Closed Loop Servo Control SystemÀ¸·Î

   ÇÏÁß Àû¿ë½Ã,  ½ÃÆí°ú ÇØ´çÇ¥¸é¿¡¼­ ¹ß»ýµÇ´Â ½ÇÁ¦ ÇÏÁßÀ»

 Á¤È®È÷ Àоî ÁÖ¸ç, ´Ù½Ã Closed LoopÀ¸·Î Á¦¾îÇÏ°Ô µÇ¾î, ½ÇÁ¦ ½ÃÆíÀÌ SoftȤÀº

 Hard ÄÚÆÃ,  º¼·Ï/¿À¸ñ/´Ù¾çÇÑ ÇüÅÂ¿Í »ó°ü¾øÀÌ ¿øÇÏ´Â ÇÏÁßÀû¿ëÀ» ¹þ¾î³ª·Á°í ÇÒ

 °æ¿ì ÀÌ Á¦¾î½Ã½ºÅÛÀº ½ÅÈ£¸¦ LoopÀ¸·Î ¿¬¼ÓÀûÀ¸·Î Á¤È®È÷ ÇÏÁßÁ¦¾î¸¦ ÇÏ°Ô µÇ¾î,

   Constant Load/Progressive load ¸ðµÎ Á¤È®È÷ ½ÃÆí¿¡ ÇÏÁßÁ¦¾î°¡ ÀÌ·ç¾îÁö°Ô µË´Ï´Ù.

   ´ëºÎºÐÀÇ À¯¸í Ÿ»ç ÀåºñµéÀº ÇÏÁßÁ¦¾î°¡ ½ÇÁ¦ Á¤È®ÇÏÁö ¾ÊÀº °æ¿ì°¡ ¸¹½À´Ï´Ù.

   º¸ÅëÀº ÀϹæÀûÀÎ ÇÏÁßÀû¿ë°ú OutputÃøÁ¤¹æ½ÄÀÔ´Ï´Ù

   2011³â ¾ÖÇðú ÀÎÅÚ ¸ðµç Çù·Â»ç¿¡¼­ Áö±×Àç±× ¹æ½Ä + 3D(¼öÁ÷ÇÏÁßÁ¦¾î/XYº¤ÅÍÇÕ ¸¶Âû·Â ÃøÁ¤¼¾¼­) ±â¼ú µµÀÔÇÏ¿© »ç¿ë!

 

   B. Scratch  (½ºÅ©·¹Ä¡¸¦ ÅëÇÏ¿© ¹Ú¸·ÄÚÆÃÀÇ  ¹°¼º °æµµ¿Í ÄÚÆÃ¹ÐÂø·Â Æò°¡)

   Maker¿¡¼­ Ư¼ö ¼³°èÇÑ Diamond Tip»Ó ¾Æ´Ï¶ó,Blade¸¦ ÀÌ¿ëÇÏ¿© ÇÏÁßÀ» Áõ°¡½Ã۸ç,

   ¹Ú¸· ¶Ç´Â Èĸ·À» ½ºÅ©·¹Ä¡ÇÏ¿© ÄÚÆÃÀ» ÆÄ±«ÇÑ blade°¡ Substrate¸¦ °¨ÁöÇÒ¶§ Àü±âÀúÇ×/Ç¥¸éÀúÇ×

   ¹× °íÀ½Çâ ŽÁö¿¡ ÀÇÇÏ¿©, Critical load¸¦ ºÐ¼®ÇÔ. ÆÄ³ë¶óƽ À̹ÌÁö ºÐ¼®¿ë µðÁöÅÐÄ«¸Þ¶ó¹× Çö¹Ì°æ ¿É¼Ç.

   ÀÌ Àåºñ´Â ¼ÒÇÁÆ® ÄÚÆÃÀç·á ȤÀº Ç¥¸éÀÌ º¼·Ï/¿À¸ñÇÑ Æ¯ÀÌÇÑ Çü»óÀÇ Ç¥¸éÀçÁúÀÇ °æ¿ì

   ±âÁ¸ÀÇ À¯¸íµµ°¡ ³ôÀº ½ºÅ©·¹Ä¡ ½ÃÇè±âµµ µ¥ÀÌÅͰ¡ ¸Å¿ì ºÒ¾ÈÁ¤ÇØÁö³ª, Ư¼öÇÑ ÇÏÁßÁ¦¾î

   ½Ã½ºÅÛÀ» µµÀÔÇÏ¿©, ÀÌ·¯ÇÑ ´ÜÁ¡À» ¿ÏÀüÈ÷ Á¦°ÅÇÑ ÃֽŠÀåºñÀÓ.

   ASTM G-171(SCRATCH HARDNESS OF MATERIALS USING A DIAMOND STYLUS)·Î 100micron~1nano meter µÎ²²ÀÇ Ãʹڸ·

   Çʸ§À̳ª ÄÚÆÃÀÇ °æµµÄ¡ ÃøÁ¤

 

 

      C. Micro Hardness/Micro Indenting(¸¶ÀÌÅ©·Î °æµµ/¹°¼º)

   ´Ù¾çÇÑ ¾ÐÀÚ¸¦ 1OOkg~0.01gram(ºÐÇØ´É:0.0005gf/ Accuracy:0.001gf)ÀÇ ¼¾¼­¸¦ ¼±Á¤ÇÏ¿© ÇÏÁßÀ»

   Á¤±³È÷ Á¶Á¤ÇÏ¿©,    

   Indentingº¯À§ 30nmºÐÇØ´ÉÀ¸·Î ÃøÁ¤¹üÀ§ 30nm~micron meter~milli meter ÃøÁ¤ºÐ¼®.´Ù¾çÇÑ ¹°¼ºÄ¡ÀÎ

   Creep/Relaxation/Youngs Modulusµî

   ÃøÁ¤ ¹×  ÇÑ ½ÃÆí¿¡¼­ ¼ö½Ê°³ÀÇ ¾ÐÁ¡À» Âï¾î ½ÃÆíÀÇ ¹°¼ºÄ¡ÀÇ ±ÕÀϼº ºÐ¼®.   

                                                    ¸¶ÀÌÅ©·Î/³ª³ë Àε§ÅÍ »çÀÌÆ®

 

   D. NANO Hardness/Nano Indenting(³ª³ë °æµµ/¹°¼º)

      Micro Á¦¾î ½Ã½ºÅÛ¿¡ »õ·Î¿î Nano ¹°¼ºÁ¦¾î½Ã½ºÅÛ Ãß°¡, ±âÁ¸ÀÇ Nano¹°¼º½ÃÇè¿ë

      ÇÏÁßÁ¦¾î½Ã½ºÅÛÀÇ Voice Coil Linear Actuator¿Í 3-Plate Capacitive Sensor¸¦

      Çõ½ÅÇÏ¿© ÀçÇö¼º¿¡ ´ëÇÑ ¾ÈÁ¤¼º Çâ»ó.

      Vertical Stroke-150 micron;

      Displacement resolution-0.4 nm; Displacement noise floor: 1 nm;

      Force Control Range : 5gram ~ 5 x 10-7gram  Force noise floor: 10nN

    

      ¿É¼ÇÃß°¡ »çÇ×À¸·Î NANO INDENTING SYSTEM¿¡ AFMÃøÁ¤ÀåÄ¡ Ãß°¡ °¡´É.

                                                                          ¸¶ÀÌÅ©·Î/³ª³ë Àε§ÅÍ »çÀÌÆ®

                                             

 

                                                                  ´Ù¸¥ ŸÀÔÀÇ 900 ÀÚµ¿ ¾ÐÁ¡ ÃÊ ¹Ì¼Ò°æµµ±â »çÀÌÆ®         

 

 

  SPM MODULE-

   In Air: Contact AFM / LFM / ResonantMode AFM (semicontact+noncontact)

           AFM / Phase Imaging(Options: Force Modulation(viscoelastisity)/

           Adhesion force imaging / Spreading Resistance Imaging / SCM /

           SKM / MFM / EFM / FM Voltage, Lithography:local probe

           oxidation,nanoscratching )

                     

   In Liquid: (Options:Contact AFM / LFM / ResonantMode AFM (semicontact+noncontact)/

               Phase Imaging / Force Modulation(viscoelastisity)/

               Adhesion force imaging )

  

    - Small samples (up to 100X100X20 mm ) can be tested

    - Scanners: 50X50X2.5 (+/-10%) micron; 90X90X5 (+/-10%) micron (option)

    - Min. Scanning Step(Z): 0.006 nm; 0.012 nm (option if 90X90X5 micron Scanner)

    - Lateral Resolution : 1~3 nano meter

    - Scan type: by probe

    - Sample positioning range : 5X5 mm

    - Positioning resolution: 5 micron

    - Optical viewing system:Numerical aperture 0.1/ Magnification: 50X/

                             Horizontal field of view: 0.5 mm

    - Control system: SPM controller                               

 

     E. Friction/Wear (¸¶Âû/¸¶¸ð/À±È°/³»±¸¼º ¼ö¸íÆò°¡)

   Áö±×¿Í ÀûÁ¤¼¾¼­ÀÇ º¯Çü¿¡ µû¶ó, ÇÑ ½ÃÇè±â¿¡¼­ 0.01gram-200kgÇÏÁßÀ» Á¤±³È÷ Á¶Á¤°¡´ÉÇϸç,

   Çɿµð½ºÅ©,¿Õº¹µ¿½Ä,Block on Ring,Four BallµîÀÇ ½ÇÇèÀ» °í¿Â,Áø°ø,ºÎ½Ä¼º °³½º¹× ´Ù¾ç

   ÇÑ ºÐÀ§±â¸¦ Á¶¼ºÇÏ¿© ½ÇÇèÀ» Çϴ ȹ±âÀûÀÎ ÀåºñÀÓ.

   ¶ÇÇÑ Çϵåµð½ºÅ© ¹× DVD/CD-R/CD-RW µîÀÇ ÄÚÆÃ ¹× ¹ÝµµÃ¼ WAFERÀÇ °øÁ¤¿¡¼­ Ç¥¸éÀÇ ¿­º¯Çü

   ¹× ¸¶Âû,¸¶¸ðÀ²,À±È°,¿¬¸¶Æ¯¼ºµîÀ» Á¤±³È÷ ºÐ¼®ÇÔ.

 

                                          ¾Æ·¡ ½ÇÇè DATA SHEET ÂüÁ¶ ÇϽñ⠹ٶø´Ï´Ù.!!!

 

   F. Creep(ÀÏÁ¤ÇÑ ÇÏÁß¿¡ ´ëÇÑ,±Ý¼ÓÀÇ º¯ÇüÀ²)  

   Åº¼º¹°ÁúÀ̳ª ƯÁ¤ Àç·á¹× ±â±¸¸¦ ÀÏÁ¤ÇÑ ÇÏÁßÀ» °¡ÇÏ¿© ´ë»ó¹°ÁúÀÇ º¯ÇüÀ²

   À» ÃøÁ¤Çϸç, ¹Ý´ëÀÇ ¼ºÁúÀÎ ÀÏÁ¤ÇÑ º¯Çü¿¡ ´ëÇÑ ÇÏÁßÀÇ º¯È­Ä¡ÀÎ Relaxation¿¡ ´ëÇÑ

   ÃøÁ¤.

 

   G. Tensile( ÀÎÀå, ¾ÐÃà)

   Video/Audio/Magnetic Tape¸¦ ÀÎÀå½ÃÇè±â¿Í °°ÀÌ Àû¿ëµÈ ÀÎÀå·Â¿¡ ´ëÇÑ Åº¼ºÀ² ¹×

    º¯Çü·üÀ» ºÐ¼®.

    CANTILEVER¿Í °°Àº MEMSÀÇ ±â°èÀûƯ¼º(Elastic Modulus/Internal Stress/Stiffness) ¹×

    Ç¥¸éƯ¼º ½ÇÇè¿¡ ÀûÇÕ.

                         

3.Àû¿ë¹üÀ§

 

A.¹Ú¸· Èĸ· µî ´Ù¾çÇÑ ÄÚÆÃ¹× ÀçÁúÀÇ Á¢Âø·Â Æò°¡, Delamination, ½ºÅ©·¹Ä¡ ÀúÇ×¼º/°æµµÆ¯¼º Æò°¡

B.LCD/PDP DisplayÀÇ ITO ÄÚÆÃ°ú °°Àº Ãʹڸ·ÀÇ Á¢ÂøÆ¯¼º Æò°¡.

C.Ãʹڸ· µî ³ª³ë ¹°¼º Æò°¡(½ºÅ©·¡Ä¡¿Í Indenting¹æ½Ä)

D.MEMS(Micro Electronic Machine SystemÀÇ ¹°¼º) -Cantilevar¿Í °°Àº MEMS±¸Á¶¹°ÀÇ Young's Modulus, Internal Stressµî ÃøÁ¤

C.±¤µð½ºÅ©(DVD,CD-R/RW),¸¶±×³×ƽ Çìµå/¸¶±×Åׯ½ Å×ÀÌÇÁ,MediaÀÇ ¹°¼º ¹× Ç¥¸é ¸¶Âû¸¶¸ðƯ¼º
D.Fastner, Paper

E.ÀÇ·á¿ë ¼ö¼ú tool, needle,suture,ballon

F.À¯¸®, ¾È°æ·»Áî, Á¾ÀÌÀÇ ÄÚÆÃÁ¢Âø·Â Æò°¡,

G.À±È°À¯ Ư¼º

H.ÄÚÆÃÀÇ °üÅëÀ²,

I.¸éµµ³¯µîÀÇ Sharpness ¹× ³»¸¶¸ðµµ Æò°¡.

H.¹ÝµµÃ¼ ¿þÀÌÆÛ ÄÚÆÃ ±â¼ú ¹× CMP TESTER

         -º°µµ·Î CMP Tester ¹× Control Device¸¦ °ø±Þ(»ç¿ëÀÚ :Applied Material, Speed Fam/IPEC,

                                                                           Rodel,IBM..µî)

       

                                                                                   <CMP TESTERÀÚ·á>

4.¼¼ºÎ »ç¾ç

 

´Ù¾çÇÑ ¹üÀ§ÀÇ ÃÊÁ¤¹Ð¼¾¼­¸¦ Çʿ信 µû¶ó ÃßÈÄ ±¸¸Å Àû¿ë °¡´É.

-ÃÖ¼Ò ¼öÁ÷ ÇÏÁßÁ¦¾î : 0.01g-1gf(Á¦¾î¹× ÃøÁ¤)

-Nano Indenter ¿ë ÃÖ¼Ò¼öÁ÷ÇÏÁßÁ¦¾î : 5 x 10-7gramf

-ÃÖ¼Ò ¼öÁ÷ÇÏÁß ºÐÇØ´É  : 0.0005gf

-ÃÖ´ëÀû¿ëÇÏÁß : Over 200kg(Áö±×º¯È¯) ±¤¹üÀ§ÇÑ ¿ëµµ Àû¿ë.

-¼öÁ÷ º¯À§ ÃÖ¼Ò ºÐÇØ´É:   30nm, 0.5micron meter µÎ°¡Áö

-Nano Indenter¿ë ¼öÁ÷º¯À§ ºÐÇØ´É: 0.4nano meter

-ȸÀü½Ä ¸¶ÂûȸÀü ¼Óµµ : 0.001~12,000rpm

-¿Õº¹µ¿½Ä Ãִ븶Âû¼Óµµ: 50Hz

-X,Y,ZÃà ¿îµ¿ ¹× ¼ÓµµÁ¶Àý.

-Àڻ簳¹ß¼¾¼­ : 2 Axis Friction/Load ¼¾¼­

                Strain gauge sensor 

                Capacitance wear/deformation sensor

                Electrical Resistance Sensor(ECR)/ESR

                High Frequency Acoustic Sensor

                ¸¸´É¿¡ °¡±î¿î ½ÃÇ豸ÇöÀ» À§ÇÑ ´Ù¾çÇÑ Áö±×

 

ÀÌ °èÃø±âÀÇ Çõ½ÅÀû Á¦¾î ¹× ¼¾¼­ ¿ø¸®¸¦ ¾Ë°í½ÍÀ¸½Ã¸é ¿¬¶ôÁֽñ⠹ٶø´Ï´Ù  

          -Overcoat duability for MEMS ( PDF file, 318 Kb)   
         
 -Scratch-resistance of thin coatings Testing Method  ( PDF file, 416Kb)

             for Ultra thin Diamond Like Carbon Film.
          
-Evaluation of Transparency Films Testing Method ( PDF file, 197 Kb)

          -ÄÚ´× Glass Ç¥¸éÀÇ Á¢Âø·Â ½ÃÇè ( PDF file, 197 Kb )

          -·»Áî¹× Glass ÄÚÆÃ¿¡ ´ëÇÑ Scratch/Á¢Âø·Â ½ÃÇè ( PDF file, 197 Kb)  

       -Pull-off force (vertical stiction) test Testing Method ( PDF file, 82Kb)
       -Flexible Magnetic Media studies ( PDF file, 318 Kb)
       -Measurement of The Elastic Modulus of Magnetic Tapes ( PDF file, 81 Kb)
       -Elastic Properties of Micro-Springs ( PDF file, 117 Kb)
       -Tribology Test of Fasteners:Optimization of Materials (PDF file, 318 Kb)
       -Lubricating Properties of Oils  (PDF file, 96 Kb)  

       -Lubricating Long Term Stability Test  (PDF file, 113 Kb)  

      -Mechanical Tester for Bio-Medical Materials and Devices( PDF file, 725Kb)
      -Carbon Brush & Copper-Electrical Contact Test  (PDF file, 550 Kb)

      -One finger & Three Finger Connector Test(PDF file, 1460 Kb)

      -NANO Hardenss + AFM ÃøÁ¤ ( PDF file, 758 Kb)

     -NANO Hardeness +SPM( PDF file, 158 Kb)

    -Micro/Nano Hardness Test( PDF file, 74 Kb)

 

    

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